A better understanding of material properties requires the precise investigation of microstructures as well as lattice defects and defect structures. The characterisation of these lattice defects as well as very small microstructural details is possible using transmission electron microscopy. Together with the Joint Laboratory for Electron Microscopy (GFE), the Chair of Corrosion and Corrosion Protection (KKS) and the I. Physikalisches Institut (IA), the IMM has a brand new modern transmission electron microscope (TEM). The microscope is the JEM-F200 from JEOL and has a wide range of analysis and examination methods. Besides classical TEM examinations, an additional STEM unit with a STEM detector and a BSE detector is available. The measurement of local composition is also possible with an EDX detector. Also available is an ASTAR system, which allows mapping of local crystal structures and orientations. A tomography system will also be available in the near future.

Possible applications:

• Characterisation of local microstructure components down to the atomic level
• Characterisation of lattice defects
• Measurement of local chemical compositions

Technical data:

• JEM-F200 from JEOL
• Operation at 80 kV and 200 kV acceleration voltage
• Gatan OneView Kamera
• STEM Unit
• SE-/BSE Detector
• Windowless EDX Detector (Oxford)
• ASTAR